In situ neutron reflectivity studies of polybithiophene

Stephen J. Roser*, Robert M. Richardson, Marcus J. Swann, A. Robert Hillman

*Corresponding author for this work

    Research output: Contribution to journalArticle (Academic Journal)peer-review

    11 Citations (Scopus)

    Abstract

    In situ neutron reflection experiments have been used to obtain the thickness and density profile of polybithiophene films perpendicular to the surface of a Pd electrode. Undoped films are dense and contain little solvent or electrolyte. The scattering length density of the neutral (undoped) polymer allows estimation of the amount of polymer and hence the charge density per thiophene ring on the oxidised (doped) form of the polymer.

    Original languageEnglish
    Pages (from-to)2863-2864
    Number of pages2
    JournalJournal of the Chemical Society, Faraday Transactions
    Volume87
    Issue number17
    DOIs
    Publication statusPublished - 1 Dec 1991

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