TY - JOUR
T1 - In situ neutron reflectivity studies of polybithiophene
AU - Roser, Stephen J.
AU - Richardson, Robert M.
AU - Swann, Marcus J.
AU - Hillman, A. Robert
PY - 1991/12/1
Y1 - 1991/12/1
N2 - In situ neutron reflection experiments have been used to obtain the thickness and density profile of polybithiophene films perpendicular to the surface of a Pd electrode. Undoped films are dense and contain little solvent or electrolyte. The scattering length density of the neutral (undoped) polymer allows estimation of the amount of polymer and hence the charge density per thiophene ring on the oxidised (doped) form of the polymer.
AB - In situ neutron reflection experiments have been used to obtain the thickness and density profile of polybithiophene films perpendicular to the surface of a Pd electrode. Undoped films are dense and contain little solvent or electrolyte. The scattering length density of the neutral (undoped) polymer allows estimation of the amount of polymer and hence the charge density per thiophene ring on the oxidised (doped) form of the polymer.
UR - http://www.scopus.com/inward/record.url?scp=0344871537&partnerID=8YFLogxK
U2 - 10.1039/FT9918702863
DO - 10.1039/FT9918702863
M3 - Article (Academic Journal)
AN - SCOPUS:0344871537
SN - 0956-5000
VL - 87
SP - 2863
EP - 2864
JO - Journal of the Chemical Society, Faraday Transactions
JF - Journal of the Chemical Society, Faraday Transactions
IS - 17
ER -