In situ neutron reflectivity studies of polybithiophene

Stephen J. Roser; Robert M. Richardson; Marcus J. Swann; A. Robert Hillman

doi:10.1039/FT9918702863

In situ neutron reflectivity studies of polybithiophene

Stephen J. Roser^*
, Robert M. Richardson
, Marcus J. Swann
, A. Robert Hillman

^*Corresponding author for this work

Research output: Contribution to journal › Article (Academic Journal) › peer-review

12 Citations (Scopus)

Abstract

In situ neutron reflection experiments have been used to obtain the thickness and density profile of polybithiophene films perpendicular to the surface of a Pd electrode. Undoped films are dense and contain little solvent or electrolyte. The scattering length density of the neutral (undoped) polymer allows estimation of the amount of polymer and hence the charge density per thiophene ring on the oxidised (doped) form of the polymer.

Original language	English
Pages (from-to)	2863-2864
Number of pages	2
Journal	Journal of the Chemical Society, Faraday Transactions
Volume	87
Issue number	17
DOIs	https://doi.org/10.1039/FT9918702863
Publication status	Published - 1 Dec 1991

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title = "In situ neutron reflectivity studies of polybithiophene",

abstract = "In situ neutron reflection experiments have been used to obtain the thickness and density profile of polybithiophene films perpendicular to the surface of a Pd electrode. Undoped films are dense and contain little solvent or electrolyte. The scattering length density of the neutral (undoped) polymer allows estimation of the amount of polymer and hence the charge density per thiophene ring on the oxidised (doped) form of the polymer.",

author = "Roser, \{Stephen J.\} and Richardson, \{Robert M.\} and Swann, \{Marcus J.\} and Hillman, \{A. Robert\}",

year = "1991",

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doi = "10.1039/FT9918702863",

language = "English",

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journal = "Journal of the Chemical Society, Faraday Transactions",

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T1 - In situ neutron reflectivity studies of polybithiophene

AU - Roser, Stephen J.

AU - Richardson, Robert M.

AU - Swann, Marcus J.

AU - Hillman, A. Robert

PY - 1991/12/1

Y1 - 1991/12/1

N2 - In situ neutron reflection experiments have been used to obtain the thickness and density profile of polybithiophene films perpendicular to the surface of a Pd electrode. Undoped films are dense and contain little solvent or electrolyte. The scattering length density of the neutral (undoped) polymer allows estimation of the amount of polymer and hence the charge density per thiophene ring on the oxidised (doped) form of the polymer.

AB - In situ neutron reflection experiments have been used to obtain the thickness and density profile of polybithiophene films perpendicular to the surface of a Pd electrode. Undoped films are dense and contain little solvent or electrolyte. The scattering length density of the neutral (undoped) polymer allows estimation of the amount of polymer and hence the charge density per thiophene ring on the oxidised (doped) form of the polymer.

UR - https://www.scopus.com/pages/publications/0344871537

U2 - 10.1039/FT9918702863

DO - 10.1039/FT9918702863

M3 - Article (Academic Journal)

AN - SCOPUS:0344871537

SN - 0956-5000

VL - 87

SP - 2863

EP - 2864

JO - Journal of the Chemical Society, Faraday Transactions

JF - Journal of the Chemical Society, Faraday Transactions

IS - 17

ER -

In situ neutron reflectivity studies of polybithiophene

Abstract

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