Increasing Memory Yield in Future Technologies through Innovative Design

Argyrides Costas; Lisboa Carlos; Yamani Ahmad Al; Carro Luigi; Dhiraj Pradhan

Increasing Memory Yield in Future Technologies through Innovative Design

Argyrides Costas, Lisboa Carlos, Yamani Ahmad Al, Carro Luigi, Dhiraj Pradhan

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

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Abstract

Future technologies, with ever shrinking devices and higher densities, bring along higher defect rates and lower yield. Memory chips, which are among the densest circuits used in digital systems, are greatly impacted by the increasing defect rates, which make yield fall and production costs rise sharply. In this paper, a new approach for designing memory chips to be manufactured using future technologies is proposed, aiming to increase the overall yield. The proposed approach trades a small area overhead for dramatic production cost reduction, by allowing to use more defective memory chips as lower capacity ones, instead of discarding them.

Translated title of the contribution	Increasing Memory Yield in Future Technologies through Innovative Design
Original language	English
Title of host publication	IEEE International Symposium on Quality Electronic Design. (ISQED 09)
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Publication status	Published - 2009

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Conference Proceedings/Title of Journal: IEEE International Symposium on Quality Electronic Design. (ISQED 09)
Other identifier: 2000959

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@inproceedings{1f8e433dbbb8427da9925bfc9c4829fe,

title = "Increasing Memory Yield in Future Technologies through Innovative Design",

abstract = "Future technologies, with ever shrinking devices and higher densities, bring along higher defect rates and lower yield. Memory chips, which are among the densest circuits used in digital systems, are greatly impacted by the increasing defect rates, which make yield fall and production costs rise sharply. In this paper, a new approach for designing memory chips to be manufactured using future technologies is proposed, aiming to increase the overall yield. The proposed approach trades a small area overhead for dramatic production cost reduction, by allowing to use more defective memory chips as lower capacity ones, instead of discarding them. ",

author = "Argyrides Costas and Lisboa Carlos and \{Ahmad Al\}, Yamani and Carro Luigi and Dhiraj Pradhan",

note = "Other page information: - Conference Proceedings/Title of Journal: IEEE International Symposium on Quality Electronic Design. (ISQED 09) Other identifier: 2000959",

year = "2009",

language = "English",

booktitle = "IEEE International Symposium on Quality Electronic Design. (ISQED 09)",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

address = "United States",

}

Increasing Memory Yield in Future Technologies through Innovative Design. / Costas, Argyrides; Carlos, Lisboa; Ahmad Al, Yamani et al.
IEEE International Symposium on Quality Electronic Design. (ISQED 09). Institute of Electrical and Electronics Engineers (IEEE), 2009.

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

TY - GEN

T1 - Increasing Memory Yield in Future Technologies through Innovative Design

AU - Costas, Argyrides

AU - Carlos, Lisboa

AU - Ahmad Al, Yamani

AU - Luigi, Carro

AU - Pradhan, Dhiraj

N1 - Other page information: - Conference Proceedings/Title of Journal: IEEE International Symposium on Quality Electronic Design. (ISQED 09) Other identifier: 2000959

PY - 2009

Y1 - 2009

N2 - Future technologies, with ever shrinking devices and higher densities, bring along higher defect rates and lower yield. Memory chips, which are among the densest circuits used in digital systems, are greatly impacted by the increasing defect rates, which make yield fall and production costs rise sharply. In this paper, a new approach for designing memory chips to be manufactured using future technologies is proposed, aiming to increase the overall yield. The proposed approach trades a small area overhead for dramatic production cost reduction, by allowing to use more defective memory chips as lower capacity ones, instead of discarding them.

AB - Future technologies, with ever shrinking devices and higher densities, bring along higher defect rates and lower yield. Memory chips, which are among the densest circuits used in digital systems, are greatly impacted by the increasing defect rates, which make yield fall and production costs rise sharply. In this paper, a new approach for designing memory chips to be manufactured using future technologies is proposed, aiming to increase the overall yield. The proposed approach trades a small area overhead for dramatic production cost reduction, by allowing to use more defective memory chips as lower capacity ones, instead of discarding them.

M3 - Conference Contribution (Conference Proceeding)

BT - IEEE International Symposium on Quality Electronic Design. (ISQED 09)

PB - Institute of Electrical and Electronics Engineers (IEEE)

ER -

Increasing Memory Yield in Future Technologies through Innovative Design

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