Increasing shear force microscopy scanning rate using active quality-factor control

M Antognozzi, MD Szczelkun, ADL Humphris, MJ Miles

Research output: Contribution to journalArticle (Academic Journal)

27 Citations (Scopus)
Original languageEnglish
Pages (from-to)2761 - 2763
Number of pages3
JournalApplied Physics Letters
Volume82 (17)
Publication statusPublished - 28 Apr 2003

Bibliographical note

Publisher: American Institute of Physics

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