Increasing shear force microscopy scanning rate using active quality-factor control

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Translated title of the contribution	Increasing shear force microscopy scanning rate using active quality-factor control
Original language	English
Pages (from-to)	2761 - 2763
Number of pages	3
Journal	Applied Physics Letters
Volume	82 (17)
DOIs	https://doi.org/10.1063/1.1571233
Publication status	Published - 28 Apr 2003

Publisher: American Institute of Physics

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@article{5a4e45d557fb40deacf5b24b9b727c6d,

title = "Increasing shear force microscopy scanning rate using active quality-factor control",

author = "M Antognozzi and MD Szczelkun and ADL Humphris and MJ Miles",

note = "Publisher: American Institute of Physics",

year = "2003",

month = apr,

day = "28",

doi = "10.1063/1.1571233",

language = "English",

volume = "82 (17)",

pages = "2761 -- 2763",

journal = "Applied Physics Letters",

issn = "1077-3118",

publisher = "American Institute of Physics (AIP)",

}

TY - JOUR

T1 - Increasing shear force microscopy scanning rate using active quality-factor control

AU - Antognozzi, M

AU - Szczelkun, MD

AU - Humphris, ADL

AU - Miles, MJ

N1 - Publisher: American Institute of Physics

PY - 2003/4/28

Y1 - 2003/4/28

U2 - 10.1063/1.1571233

DO - 10.1063/1.1571233

M3 - Article (Academic Journal)

SN - 1077-3118

VL - 82 (17)

SP - 2761

EP - 2763

JO - Applied Physics Letters

JF - Applied Physics Letters

ER -