Original language | English |
---|---|
Pages (from-to) | 872-879 |
Number of pages | 8 |
Journal | IEEE Transactions on Nuclear Science |
Volume | 59 |
Issue number | 4 |
Publication status | Published - 2012 |
Influence of User-Controlled Parameters in Alpha Particle-Induced Single-Event Error Rates in Commercial SRAM Cells
Indranil Chatterjee, Bharat L Bhuva, Shi-Jie Wen, Richard Wong
Research output: Contribution to journal › Article (Academic Journal) › peer-review
4
Citations
(Scopus)