InN Thin Film Lattice Dynamics by Grazing Incidence Inelastic X-Ray Scattering

J Serrano, A Bosak, M Krisch, F.J Manjon, A.H Romero, N Garro, X Wang, A Yoshikawa, M Kuball

Research output: Contribution to journalArticle (Academic Journal)peer-review

30 Citations (Scopus)

Abstract

Achieving comprehensive information on thin film lattice dynamics so far has eluded well established spectroscopic techniques. We demonstrate here the novel application of grazing incidence inelastic x-ray scattering combined with ab initio calculations to determine the complete elastic stiffness tensor, the acoustic and low-energy optic phonon dispersion relations of thin wurtzite indium nitride films. Indium nitride is an especially relevant example, due to the technological interest for optoelectronic and solar cell applications in combination with other group III nitrides.
Translated title of the contributionInN Thin Film Lattice Dynamics by Grazing Incidence Inelastic X-Ray Scattering
Original languageEnglish
Article number205501
Pages (from-to)1-4
Number of pages4
JournalPhysical Review Letters
Volume106
Issue number20
DOIs
Publication statusPublished - May 2011

Structured keywords

  • CDTR

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