Integrated Raman – IR Thermography for Reliability and Performance Optimization, and Failure Analysis of Electronic Devices

M Kuball, A Sarua, JW Pomeroy, A Falk, G Albright, MJ Uren, T Martin

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

4 Citations (Scopus)
Translated title of the contributionIntegrated Raman – IR Thermography for Reliability and Performance Optimization, and Failure Analysis of Electronic Devices
Original languageEnglish
Title of host publication‘33rd International Symposium for Testing and Failure Analysis (ISTFA)’, San Jose / USA, 2007
PublisherThe Electronic Device Failure Analysis Society
Pages1 - 5
Number of pages5
ISBN (Print)9780871708632
Publication statusPublished - 2007

Bibliographical note

Conference Proceedings/Title of Journal: ISTFA 2007: Conference Proceedings of 33rd ISTFA
Conference Organiser: The Electronic Device Failure Analysis Society

Structured keywords

  • CDTR

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