Translated title of the contribution | Integrated Raman – IR Thermography for Reliability and Performance Optimization, and Failure Analysis of Electronic Devices |
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Original language | English |
Title of host publication | ‘33rd International Symposium for Testing and Failure Analysis (ISTFA)’, San Jose / USA, 2007 |
Publisher | The Electronic Device Failure Analysis Society |
Pages | 1 - 5 |
Number of pages | 5 |
ISBN (Print) | 9780871708632 |
Publication status | Published - 2007 |
Bibliographical note
Conference Proceedings/Title of Journal: ISTFA 2007: Conference Proceedings of 33rd ISTFAConference Organiser: The Electronic Device Failure Analysis Society
Structured keywords
- CDTR