Integrated Raman – IR Thermography for Reliability and Performance Optimization, and Failure Analysis of Electronic Devices

M Kuball; A Sarua; JW Pomeroy; A Falk; G Albright; MJ Uren; T Martin

Integrated Raman – IR Thermography for Reliability and Performance Optimization, and Failure Analysis of Electronic Devices

M Kuball, A Sarua, JW Pomeroy, A Falk, G Albright, MJ Uren, T Martin

School of Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

4 Citations (Scopus)

Translated title of the contribution	Integrated Raman – IR Thermography for Reliability and Performance Optimization, and Failure Analysis of Electronic Devices
Original language	English
Title of host publication	‘33rd International Symposium for Testing and Failure Analysis (ISTFA)’, San Jose / USA, 2007
Publisher	The Electronic Device Failure Analysis Society
Pages	1 - 5
Number of pages	5
ISBN (Print)	9780871708632
Publication status	Published - 2007

Bibliographical note

Conference Proceedings/Title of Journal: ISTFA 2007: Conference Proceedings of 33rd ISTFA
Conference Organiser: The Electronic Device Failure Analysis Society

Structured keywords

CDTR

Cite this

Kuball, M., Sarua, A., Pomeroy, JW., Falk, A., Albright, G., Uren, MJ., & Martin, T. (2007). Integrated Raman – IR Thermography for Reliability and Performance Optimization, and Failure Analysis of Electronic Devices. In ‘33rd International Symposium for Testing and Failure Analysis (ISTFA)’, San Jose / USA, 2007 (pp. 1 - 5). The Electronic Device Failure Analysis Society.

Kuball, M ; Sarua, A ; Pomeroy, JW ; Falk, A ; Albright, G ; Uren, MJ ; Martin, T. / Integrated Raman – IR Thermography for Reliability and Performance Optimization, and Failure Analysis of Electronic Devices. ‘33rd International Symposium for Testing and Failure Analysis (ISTFA)’, San Jose / USA, 2007. The Electronic Device Failure Analysis Society, 2007. pp. 1 - 5

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title = "Integrated Raman – IR Thermography for Reliability and Performance Optimization, and Failure Analysis of Electronic Devices",

author = "M Kuball and A Sarua and JW Pomeroy and A Falk and G Albright and MJ Uren and T Martin",

note = "Conference Proceedings/Title of Journal: ISTFA 2007: Conference Proceedings of 33rd ISTFA Conference Organiser: The Electronic Device Failure Analysis Society",

year = "2007",

language = "English",

isbn = "9780871708632",

pages = "1 -- 5",

booktitle = "{\textquoteleft}33rd International Symposium for Testing and Failure Analysis (ISTFA){\textquoteright}, San Jose / USA, 2007",

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Kuball, M , Sarua, A , Pomeroy, JW, Falk, A, Albright, G, Uren, MJ & Martin, T 2007, Integrated Raman – IR Thermography for Reliability and Performance Optimization, and Failure Analysis of Electronic Devices. in ‘33rd International Symposium for Testing and Failure Analysis (ISTFA)’, San Jose / USA, 2007. The Electronic Device Failure Analysis Society, pp. 1 - 5.

Integrated Raman – IR Thermography for Reliability and Performance Optimization, and Failure Analysis of Electronic Devices. / Kuball, M ; Sarua, A ; Pomeroy, JW; Falk, A; Albright, G; Uren, MJ; Martin, T.

‘33rd International Symposium for Testing and Failure Analysis (ISTFA)’, San Jose / USA, 2007. The Electronic Device Failure Analysis Society, 2007. p. 1 - 5.

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

TY - GEN

T1 - Integrated Raman – IR Thermography for Reliability and Performance Optimization, and Failure Analysis of Electronic Devices

AU - Kuball, M

AU - Sarua, A

AU - Pomeroy, JW

AU - Falk, A

AU - Albright, G

AU - Uren, MJ

AU - Martin, T

N1 - Conference Proceedings/Title of Journal: ISTFA 2007: Conference Proceedings of 33rd ISTFA Conference Organiser: The Electronic Device Failure Analysis Society

PY - 2007

Y1 - 2007

M3 - Conference Contribution (Conference Proceeding)

SN - 9780871708632

SP - 1

EP - 5

BT - ‘33rd International Symposium for Testing and Failure Analysis (ISTFA)’, San Jose / USA, 2007

PB - The Electronic Device Failure Analysis Society

ER -