Intersecting Machining Feature Localization and Recognition via Single Shot Multibox Detector

Peizhi Shi, Qunfen Qi*, Yuchu Qin, Paul J. Scott, Xiangqian Jiang

*Corresponding author for this work

Research output: Contribution to journalArticle (Academic Journal)peer-review

32 Citations (Scopus)

Abstract

In Industrie 4.0, machines are expected to become autonomous, self-aware and self-correcting. One important step in the area of manufacturing is feature recognition that aims to detect all the machining features from a 3-D model. In this research area, recognizing and locating a wide variety of highly intersecting features are extremely challenging as the topology information of features is substantially damaged because of the feature intersection. Motivated by the single shot multibox detector (SSD), this article presents a novel deep learning approach named SsdNet to tackle the machining feature localization and recognition problem. The typical SSD is designed for 2-D image objection detection rather than 3-D feature recognition. Therefore, the network architecture and output of SSD are modified to fulfil the purpose of this research. In addition, some advanced techniques are also utilized to further enhance the recognition performance. Experimental results on the benchmark dataset confirm that the proposed method achieves the state-of-the-art feature recognition performance (95.20% F-score), localization performance (90.62% F-score), and recognition efficiency (243.85 ms per model).

Original languageEnglish
Article number9222288
Pages (from-to)3292-3302
Number of pages11
JournalIEEE Transactions on Industrial Informatics
Volume17
Issue number5
Early online date13 Oct 2021
DOIs
Publication statusE-pub ahead of print - 13 Oct 2021

Bibliographical note

Funding Information:
Manuscript received May 12, 2020; revised September 9, 2020; accepted October 7, 2020. Date of publication October 13, 2020; date of current version February 22, 2021. This work was supported in part by the EPSRC UKRI Innovation Fellowship (Ref. EP/S001328/1), in part by EPSRC Future Advanced Metrology Hub (Ref. EP/P006930/1), and in part by EPSRC Fellowship in Manufacturing (Ref. EP/R024162/1). Paper no. TII-20-2436. (Corresponding author: Qunfen Qi.) The authors are with the EPSRC Future Advanced Metrology Hub, School of Computing and Engineering, University of Huddersfield, Hud-dersfield HD1 3DH, U.K. (e-mail: [email protected]; [email protected]; [email protected]; [email protected]; [email protected]).

Publisher Copyright:
© 2005-2012 IEEE.

Keywords

  • 3-D feature localization
  • Deep learning
  • feature recognition
  • Industrie 4.0
  • single shot multibox detector (SSD)

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