Investigating the reliability of SiC MOSFET body diodes using fourier series modelling

Roozbeh Bonyadi, O. Alatise, S. Jahdi, J. Hu, L. Evans, P. A. Mawby

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

13 Citations (Scopus)

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Engineering & Materials Science