Investigation of aluminium thin films using electron backscatter diffraction and the new technique of orientation imaging microscopy

DJ Dingley, DP Field

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

Translated title of the contributionInvestigation of aluminium thin films using electron backscatter diffraction and the new technique of orientation imaging microscopy
Original languageEnglish
Title of host publicationPolycrystalline Thin Films: Structure, Texture Properties and Application II, Symposium Mater. Res. Soc., Pittsburgh USA
PublisherMRS
Pages197 - 206
Volume403
Publication statusPublished - 1996

Cite this

Dingley, DJ., & Field, DP. (1996). Investigation of aluminium thin films using electron backscatter diffraction and the new technique of orientation imaging microscopy. In Polycrystalline Thin Films: Structure, Texture Properties and Application II, Symposium Mater. Res. Soc., Pittsburgh USA (Vol. 403, pp. 197 - 206). MRS.