Investigation of Si/SiGe quantum dot structures by large angle CBED and finite element analysis

AA Hovsepian, D Cherns, W Jaeger

Research output: Contribution to journalArticle (Academic Journal)peer-review

Translated title of the contributionInvestigation of Si/SiGe quantum dot structures by large angle CBED and finite element analysis
Original languageEnglish
Pages (from-to)413 - 416
JournalProc. of Electron Microscopy and Analysis 1997, IOP Conf. Ser
Volume153
Publication statusPublished - 1997

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