Investigation of the Static Performance and Avalanche Reliability of High Voltage 4H-SiC Merged-PiN-Schottky Diodes

Chengjun Shen, Saeed Jahdi, Phil H Mellor, Juefei Yang, Erfan Bashar, Jose Ortiz-Gonzalez, Olayiwola Alatise

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

38 Downloads (Pure)

Fingerprint

Dive into the research topics of 'Investigation of the Static Performance and Avalanche Reliability of High Voltage 4H-SiC Merged-PiN-Schottky Diodes'. Together they form a unique fingerprint.

Earth and Planetary Sciences

Engineering