(Invited) intrinsic reliability assessment of 650V rated AlGaN/GaN based power devices: an industry perspective

Peter Moens, A Banerjee, Aurore Constant, Peter Coppens, Marcus Caesar, Zilan Li, Steven Vanderweghe, Frederick Declercq, Balaji Padmanabhan, Woochul Jeon, Jia Guo, Ali Salih, M. Tack, M. Meneghini, Stefano Dalcanale, A Tajilli, G. Meneghesso, E. Zanoni, Michael Uren, Indranil ChatterjeeSerge Karboyan, Martin Kuball

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

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