Learning from General Label Constraints

T De Bie, J Suykens, B De Moor

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

23 Citations (Scopus)
Translated title of the contributionLearning from General Label Constraints
Original languageEnglish
Title of host publicationthe joint IAPR international workshops on Syntactical and Structural Pattern Recognition (SSPR 2004) and Statistical Pattern Recognition (SPR 2004)
Publication statusPublished - Aug 2004

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