Learning from General Label Constraints

T De Bie; J Suykens; B De Moor

Learning from General Label Constraints

T De Bie, J Suykens, B De Moor

Department of Engineering Mathematics

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

25 Citations (Scopus)

Translated title of the contribution	Learning from General Label Constraints
Original language	English
Title of host publication	the joint IAPR international workshops on Syntactical and Structural Pattern Recognition (SSPR 2004) and Statistical Pattern Recognition (SPR 2004)
Publication status	Published - Aug 2004

Access to Document

http://www.tijldebie.net/papers/TDB-JS-BDM_04.pdf

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Persistent link

Cite this

@inproceedings{293a720d49814288b15e6c3acafe0e32,

title = "Learning from General Label Constraints",

author = "{De Bie}, T and J Suykens and {De Moor}, B",

year = "2004",

month = aug,

language = "English",

booktitle = "the joint IAPR international workshops on Syntactical and Structural Pattern Recognition (SSPR 2004) and Statistical Pattern Recognition (SPR 2004)",

}