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Learning immune-defectives graph through group tests

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

2 Citations (Scopus)

Abstract

This paper abstracts the unified problem of drug discovery and pathogen identification as an inhibitor-defective classification problem and learning of 'association pattern' between the inhibitors and defectives. We refer to the 'association graph' between the inhibitors and defectives as the Immune-Defectives Graph (IDG). Here, the expression of a defective might be inhibited by a subset of the inhibitors rather than all the inhibitors as in the well-known 1-inhibitor model. A test containing a defective is positive iff it does not contain its associated inhibitor. The goal of this paper is to identify the defectives, inhibitors, and their 'associations' with high probability, or in other words, learn the IDG using group tests. We propose a probabilistic non-adaptive pooling design, a probabilistic two-stage adaptive pooling design and decoding algorithms for learning the IDG. The sample complexity of the number of tests required for the proposed two-stage adaptive pooling design is shown to be close to the lower bound, while that for the proposed non-adaptive pooling design is close to the lower bound in the large inhibitor regime.

Original languageEnglish
Title of host publicationProceedings - 2015 IEEE International Symposium on Information Theory, ISIT 2015
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages66-70
Number of pages5
ISBN (Electronic)9781467377041
DOIs
Publication statusPublished - 28 Sept 2015
EventIEEE International Symposium on Information Theory, ISIT 2015 - Hong Kong, Hong Kong
Duration: 14 Jun 2015 → 19 Jun 2015

Publication series

NameIEEE International Symposium on Information Theory - Proceedings
Volume2015-June
ISSN (Print)2157-8095

Conference

ConferenceIEEE International Symposium on Information Theory, ISIT 2015
Country/TerritoryHong Kong
CityHong Kong
Period14/06/15 → 19/06/15

Bibliographical note

Publisher Copyright:
© 2015 IEEE.

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