Low temperature penetration depth of κ-(ET)2Cu[N(CN)2]Br and κ-(ET)2Cu(NCS)2

Low temperature penetration depth of κ-(ET)₂Cu[N(CN)₂]Br and κ-(ET)₂Cu(NCS)₂

A Carrington, IJ Bonalde, R Prozorov, RW Giannetta, AM Kini, J Schlueter, HH Wang, U Geiser, JM Williams

Research output: Contribution to journal › Article (Academic Journal) › peer-review

127 Citations (Scopus)

Translated title of the contribution	Low temperature penetration depth of κ-(ET)₂Cu[N(CN)₂]Br and κ-(ET)₂Cu(NCS)₂
Original language	English
Pages (from-to)	4172 - 4175
Journal	Physical Review Letters
Volume	83
Publication status	Published - 1999

@article{0b3a781ab7ce4441ac7ac739d0ea75c0,

title = "Low temperature penetration depth of κ-(ET)2Cu[N(CN)2]Br and κ-(ET)2Cu(NCS)2",

author = "A Carrington and IJ Bonalde and R Prozorov and RW Giannetta and AM Kini and J Schlueter and HH Wang and U Geiser and JM Williams",

year = "1999",

language = "English",

volume = "83",

pages = "4172 -- 4175",

journal = "Physical Review Letters",

issn = "0031-9007",

publisher = "American Physical Society (APS)",

}

TY - JOUR

T1 - Low temperature penetration depth of κ-(ET)2Cu[N(CN)2]Br and κ-(ET)2Cu(NCS)2

AU - Carrington, A

AU - Bonalde, IJ

AU - Prozorov, R

AU - Giannetta, RW

AU - Kini, AM

AU - Schlueter, J

AU - Wang, HH

AU - Geiser, U

AU - Williams, JM

PY - 1999

Y1 - 1999

M3 - Article (Academic Journal)

VL - 83

SP - 4172

EP - 4175

JO - Physical Review Letters

JF - Physical Review Letters

SN - 0031-9007

ER -