LuRh
              2
              Si
              2
              : Sensitivity of the Fermi surface to the Si
              z
              -position: 
              Electronic structure of LuRh
              2
              Si
              2

Pascal Reiss; Patrick M. C. Rourke; Gertrud Zwicknagl; F. Malte Grosche; Sven Friedemann

doi:10.1002/pssb.201200954

LuRh 2 Si 2 : Sensitivity of the Fermi surface to the Si z -position: Electronic structure of LuRh 2 Si 2

Pascal Reiss, Patrick M. C. Rourke, Gertrud Zwicknagl, F. Malte Grosche, Sven Friedemann

School of Physics

Research output: Contribution to journal › Article (Academic Journal) › peer-review

5 Citations (Scopus)

Original language	English
Pages (from-to)	498-501
Journal	physica status solidi (b)
Volume	250
Issue number	3
DOIs	https://doi.org/10.1002/pssb.201200954
Publication status	Published - 1 Mar 2013

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Reiss, P., Rourke, P. M. C., Zwicknagl, G., Grosche, F. M., & Friedemann, S. (2013). LuRh 2 Si 2 : Sensitivity of the Fermi surface to the Si z -position: Electronic structure of LuRh 2 Si 2. physica status solidi (b), 250(3), 498-501. https://doi.org/10.1002/pssb.201200954

Reiss, Pascal ; Rourke, Patrick M. C. ; Zwicknagl, Gertrud et al. / LuRh 2 Si 2 : Sensitivity of the Fermi surface to the Si z -position : Electronic structure of LuRh 2 Si 2. In: physica status solidi (b). 2013 ; Vol. 250, No. 3. pp. 498-501.

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title = "LuRh 2 Si 2 : Sensitivity of the Fermi surface to the Si z -position: Electronic structure of LuRh 2 Si 2",

author = "Pascal Reiss and Rourke, \{Patrick M. C.\} and Gertrud Zwicknagl and Grosche, \{F. Malte\} and Sven Friedemann",

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Reiss, P, Rourke, PMC, Zwicknagl, G, Grosche, FM & Friedemann, S 2013, 'LuRh 2 Si 2 : Sensitivity of the Fermi surface to the Si z -position: Electronic structure of LuRh 2 Si 2', physica status solidi (b), vol. 250, no. 3, pp. 498-501. https://doi.org/10.1002/pssb.201200954

LuRh 2 Si 2 : Sensitivity of the Fermi surface to the Si z -position: Electronic structure of LuRh 2 Si 2. / Reiss, Pascal; Rourke, Patrick M. C.; Zwicknagl, Gertrud et al.
In: physica status solidi (b), Vol. 250, No. 3, 01.03.2013, p. 498-501.

Research output: Contribution to journal › Article (Academic Journal) › peer-review

TY - JOUR

T1 - LuRh 2 Si 2 : Sensitivity of the Fermi surface to the Si z -position

T2 - Electronic structure of LuRh 2 Si 2

AU - Reiss, Pascal

AU - Rourke, Patrick M. C.

AU - Zwicknagl, Gertrud

AU - Grosche, F. Malte

AU - Friedemann, Sven

PY - 2013/3/1

Y1 - 2013/3/1

U2 - 10.1002/pssb.201200954

DO - 10.1002/pssb.201200954

M3 - Article (Academic Journal)

SN - 0370-1972

VL - 250

SP - 498

EP - 501

JO - physica status solidi (b)

JF - physica status solidi (b)

IS - 3

ER -

Reiss P, Rourke PMC, Zwicknagl G, Grosche FM, Friedemann S. LuRh 2 Si 2 : Sensitivity of the Fermi surface to the Si z -position: Electronic structure of LuRh 2 Si 2. physica status solidi (b). 2013 Mar 1;250(3):498-501. doi: 10.1002/pssb.201200954