Mapping the dislocation sub-structure of deformed polycrystalline Ni by scanning microbeam diffraction topography

Brian Abbey, Felix Hofmann, Jonathan Belnoue, Alexander Rack, Remi Tucoulou, Gareth Hughes, Sophie Eve, Alexander M. Korsunsky

Research output: Contribution to journalArticle (Academic Journal)peer-review

13 Citations (Scopus)

Abstract

When subjected to plastic deformation, grains within ductile face-centred cubic polycrystals fragment into "soft", low dislocation density cells separated by "hard", dislocation-rich walls. Using a narrow-bandwidth, sub-micrometre X-ray beam, we have mapped the deformation structure inside a single grain within a deformed Ni polycrystal. Dislocation multiplication and entanglement was found to vary depending on the physical dimensions of the grain. The method we use overcomes current limitations in classical X-ray topography allowing topographic images to be formed from small, highly deformed grains. (C) 2011 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

Original languageEnglish
Pages (from-to)884-887
Number of pages4
JournalScripta Materialia
Volume64
Issue number9
DOIs
Publication statusPublished - May 2011

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