Maximum entropy deconvolution of resonant inelastic x-ray scattering spectra

J. Laverock*, A. R H Preston, D. Newby, K. E. Smith, S. B. Dugdale

*Corresponding author for this work

Research output: Contribution to journalArticle (Academic Journal)peer-review

12 Citations (Scopus)
288 Downloads (Pure)


Resonant inelastic x-ray scattering (RIXS) has become a powerful tool in the study of the electronic structure of condensed matter. Although the linewidths of many RIXS features are narrow, the experimental broadening can often hamper the identification of spectral features. Here we show that the maximum entropy technique can successfully be applied in the deconvolution of RIXS spectra, improving the interpretation of the loss features without a severe increase in the noise ratio. 

Original languageEnglish
Article number235111
Pages (from-to)1-6
Number of pages6
JournalPhysical Review B: Condensed Matter and Materials Physics
Issue number23
Publication statusPublished - 5 Dec 2011


Dive into the research topics of 'Maximum entropy deconvolution of resonant inelastic x-ray scattering spectra'. Together they form a unique fingerprint.

Cite this