Maximum entropy deconvolution of resonant inelastic x-ray scattering spectra

J. Laverock; A. R H Preston; D. Newby; K. E. Smith; S. B. Dugdale

doi:10.1103/PhysRevB.84.235111

Maximum entropy deconvolution of resonant inelastic x-ray scattering spectra

J. Laverock^*, A. R H Preston, D. Newby, K. E. Smith, S. B. Dugdale

^*Corresponding author for this work

School of Physics

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Abstract

Resonant inelastic x-ray scattering (RIXS) has become a powerful tool in the study of the electronic structure of condensed matter. Although the linewidths of many RIXS features are narrow, the experimental broadening can often hamper the identification of spectral features. Here we show that the maximum entropy technique can successfully be applied in the deconvolution of RIXS spectra, improving the interpretation of the loss features without a severe increase in the noise ratio.

Original language	English
Article number	235111
Pages (from-to)	1-6
Number of pages	6
Journal	Physical Review B: Condensed Matter and Materials Physics
Volume	84
Issue number	23
DOIs	https://doi.org/10.1103/PhysRevB.84.235111
Publication status	Published - 5 Dec 2011

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Physical & Theoretical

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title = "Maximum entropy deconvolution of resonant inelastic x-ray scattering spectra",

abstract = "Resonant inelastic x-ray scattering (RIXS) has become a powerful tool in the study of the electronic structure of condensed matter. Although the linewidths of many RIXS features are narrow, the experimental broadening can often hamper the identification of spectral features. Here we show that the maximum entropy technique can successfully be applied in the deconvolution of RIXS spectra, improving the interpretation of the loss features without a severe increase in the noise ratio. ",

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AU - Laverock, J.

AU - Preston, A. R H

AU - Newby, D.

AU - Smith, K. E.

AU - Dugdale, S. B.

PY - 2011/12/5

Y1 - 2011/12/5

N2 - Resonant inelastic x-ray scattering (RIXS) has become a powerful tool in the study of the electronic structure of condensed matter. Although the linewidths of many RIXS features are narrow, the experimental broadening can often hamper the identification of spectral features. Here we show that the maximum entropy technique can successfully be applied in the deconvolution of RIXS spectra, improving the interpretation of the loss features without a severe increase in the noise ratio.

AB - Resonant inelastic x-ray scattering (RIXS) has become a powerful tool in the study of the electronic structure of condensed matter. Although the linewidths of many RIXS features are narrow, the experimental broadening can often hamper the identification of spectral features. Here we show that the maximum entropy technique can successfully be applied in the deconvolution of RIXS spectra, improving the interpretation of the loss features without a severe increase in the noise ratio.

UR - https://www.scopus.com/pages/publications/84855414460

U2 - 10.1103/PhysRevB.84.235111

DO - 10.1103/PhysRevB.84.235111

M3 - Article (Academic Journal)

AN - SCOPUS:84855414460

SN - 1098-0121

VL - 84

SP - 1

EP - 6

JO - Physical Review B: Condensed Matter and Materials Physics

JF - Physical Review B: Condensed Matter and Materials Physics

IS - 23

M1 - 235111

ER -

Maximum entropy deconvolution of resonant inelastic x-ray scattering spectra

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