Measurement of low-order structure factors for silicon from zone-axis CBED patterns

M Saunders, DM Bird, NJ Zaluzec, WG Burgess, AR Preston, CJ Humphreys

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Translated title of the contribution	Measurement of low-order structure factors for silicon from zone-axis CBED patterns
Original language	English
Pages (from-to)	311 - 323
Journal	Ultramicroscopy
Volume	60
Publication status	Published - 1995

Cite this

@article{e0b18d1cb70a40aaba31f9536f40b64d,

title = "Measurement of low-order structure factors for silicon from zone-axis CBED patterns",

author = "M Saunders and DM Bird and NJ Zaluzec and WG Burgess and AR Preston and CJ Humphreys",

year = "1995",

language = "English",

volume = "60",

pages = "311 -- 323",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Amsterdam:Elsevier",

}