Translated title of the contribution | Measurement of low-order structure factors for silicon from zone-axis CBED patterns |
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Original language | English |
Pages (from-to) | 311 - 323 |
Journal | Ultramicroscopy |
Volume | 60 |
Publication status | Published - 1995 |
Measurement of low-order structure factors for silicon from zone-axis CBED patterns
M Saunders, DM Bird, NJ Zaluzec, WG Burgess, AR Preston, CJ Humphreys
Research output: Contribution to journal › Article (Academic Journal) › peer-review
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