Measurement of low-order structure factors for silicon from zone-axis CBED patterns

M Saunders, DM Bird, NJ Zaluzec, WG Burgess, AR Preston, CJ Humphreys

Research output: Contribution to journalArticle (Academic Journal)peer-review

54 Citations (Scopus)
Translated title of the contributionMeasurement of low-order structure factors for silicon from zone-axis CBED patterns
Original languageEnglish
Pages (from-to)311 - 323
JournalUltramicroscopy
Volume60
Publication statusPublished - 1995

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