Measurement of structure factors & determination of crystal thickness by electron diffraction

Research output: Chapter in Book/Report/Conference proceeding › Chapter in a book

Translated title of the contribution	Measurement of structure factors & determination of crystal thickness by electron diffraction
Original language	English
Title of host publication	International Tables for Crystallography vol C - section 4.3.7
Editors	A J C Wilson
Publisher	Kluwer Academic Publishers
Pages	363 - 365
Number of pages	2
ISBN (Print)	079231638X
Publication status	Published - 1992

Handle.net

@inbook{95b364f329bb45949a1ae6a24e7ab9f9,

title = "Measurement of structure factors \& determination of crystal thickness by electron diffraction",

author = "J Gjonnes and JW Steeds",

year = "1992",

language = "English",

isbn = "079231638X",

pages = "363 -- 365",

editor = "Wilson, \{A J C\}",

booktitle = "International Tables for Crystallography vol C - section 4.3.7",

publisher = "Kluwer Academic Publishers",

address = "Netherlands",

}