Measurement of swelling-induced residual stress in ion implanted SiC, and its effect on micromechanical properties

Alexander J. Leide, Richard I. Todd, David E.j. Armstrong

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@article{70d11a8b648a4d7b85d6edc14439709f,

title = "Measurement of swelling-induced residual stress in ion implanted SiC, and its effect on micromechanical properties",

author = "Leide, {Alexander J.} and Todd, {Richard I.} and Armstrong, {David E.j.}",

year = "2020",

month = jun,

doi = "10.1016/j.actamat.2020.06.030",

language = "English",

volume = "196",

journal = "Acta Materialia",

issn = "1359-6454",

publisher = "Elsevier Science",

}

TY - JOUR

T1 - Measurement of swelling-induced residual stress in ion implanted SiC, and its effect on micromechanical properties

AU - Leide, Alexander J.

AU - Todd, Richard I.

AU - Armstrong, David E.j.

PY - 2020/6

Y1 - 2020/6

U2 - 10.1016/j.actamat.2020.06.030

DO - 10.1016/j.actamat.2020.06.030

M3 - Article (Academic Journal)

SN - 1359-6454

VL - 196

JO - Acta Materialia

JF - Acta Materialia

ER -