Translated title of the contribution | Measurement of the piezoelectric field across strained InGaN/GaN layers by electron holography |
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Original language | English |
Pages (from-to) | 281 - 285 |
Journal | Solid State Communications |
Volume | 111 |
Publication status | Published - 1999 |
Measurement of the piezoelectric field across strained InGaN/GaN layers by electron holography
D Cherns, JS Barnard, FA Ponce
Research output: Contribution to journal › Article (Academic Journal) › peer-review
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