Measurement of the piezoelectric field across strained InGaN/GaN layers by electron holography

D Cherns, JS Barnard, FA Ponce

Research output: Contribution to journalArticle (Academic Journal)peer-review

44 Citations (Scopus)
Translated title of the contributionMeasurement of the piezoelectric field across strained InGaN/GaN layers by electron holography
Original languageEnglish
Pages (from-to)281 - 285
JournalSolid State Communications
Volume111
Publication statusPublished - 1999

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