| Translated title of the contribution | Measurement of the piezoelectric field across strained InGaN/GaN layers by electron holography |
|---|---|
| Original language | English |
| Pages (from-to) | 281 - 285 |
| Journal | Solid State Communications |
| Volume | 111 |
| Publication status | Published - 1999 |
Measurement of the piezoelectric field across strained InGaN/GaN layers by electron holography
D Cherns, JS Barnard, FA Ponce
Research output: Contribution to journal › Article (Academic Journal) › peer-review
48
Citations
(Scopus)