Merging Built-in Current Sensor with H-Tree Architecture for SRAM Reliability Improvement

Argyrides Costas, Vargas Fabian, Dhiraj Pradhan

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

Translated title of the contributionMerging Built-in Current Sensor with H-Tree Architecture for SRAM Reliability Improvement
Original languageEnglish
Title of host publicationIEEE Latin American Test Workshop (LATW 08)
Publication statusPublished - 2008

Bibliographical note

Other page information: -
Conference Proceedings/Title of Journal: IEEE Latin American Test Workshop (LATW 08)
Other identifier: 2000817

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