Merging Built-in Current Sensor with H-Tree Architecture for SRAM Reliability Improvement

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

Translated title of the contribution	Merging Built-in Current Sensor with H-Tree Architecture for SRAM Reliability Improvement
Original language	English
Title of host publication	IEEE Latin American Test Workshop (LATW 08)
Publication status	Published - 2008

Other page information: -
Conference Proceedings/Title of Journal: IEEE Latin American Test Workshop (LATW 08)
Other identifier: 2000817

Access to Document

@inproceedings{66ea756629f44b0a961af7c725d3a581,

title = "Merging Built-in Current Sensor with H-Tree Architecture for SRAM Reliability Improvement",

author = "Argyrides Costas and Vargas Fabian and Dhiraj Pradhan",

note = "Other page information: - Conference Proceedings/Title of Journal: IEEE Latin American Test Workshop (LATW 08) Other identifier: 2000817",

year = "2008",

language = "English",

booktitle = "IEEE Latin American Test Workshop (LATW 08)",

}

TY - GEN

T1 - Merging Built-in Current Sensor with H-Tree Architecture for SRAM Reliability Improvement

AU - Costas, Argyrides

AU - Fabian, Vargas

AU - Pradhan, Dhiraj

N1 - Other page information: - Conference Proceedings/Title of Journal: IEEE Latin American Test Workshop (LATW 08) Other identifier: 2000817

PY - 2008

Y1 - 2008

M3 - Conference Contribution (Conference Proceeding)

BT - IEEE Latin American Test Workshop (LATW 08)

ER -