Micro-scale testing of ductile and brittle cantilever beam specimens in situ with a dual beam workstation

J. E. Darnbrough*, D. Liu, P. E. J. Flewitt

*Corresponding author for this work

Research output: Contribution to journalArticle (Academic Journal)

14 Citations (Scopus)

Abstract

Micro-scale cantilever beam specimens created by focused ion beam milling have been mechanically loaded in situ at room temperature to observe the deformation and fracture of single crystal silicon, nanocrystalline nickel and thermal barrier coatings with a multilayer structure. The micro-scale preparation technique allows cantilever beams to be selected from preferred positions in the samples so that specific mechanical properties can be evaluated. As a consequence these microstructural specific properties can be combined with direct observation of the response of the test specimen throughout the period of the test. The measured mechanical properties and response for the materials given above are discussed and compared with previously published data.

Original languageEnglish
Article number055010
Number of pages9
JournalMeasurement Science and Technology
Volume24
Issue number5
DOIs
Publication statusPublished - May 2013

Keywords

  • micro-scale cantilever testing
  • single crystal silicon
  • nanocrystalline nickel
  • thermal barrier coatings
  • THERMAL BARRIER COATINGS
  • NANOCRYSTALLINE MATERIALS
  • MECHANICAL-PROPERTIES
  • INDENTATION
  • TOUGHNESS
  • EVOLUTION
  • FRACTURE
  • MODULUS
  • SILICON

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