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Microscale residual stress measurement in steel using focused ion beam slotting and digital image correlation

  • N Daynes
  • , GCM Horne
  • , PJ Heard
  • , DZL Hodgson
  • , A Shterenlikht

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

Translated title of the contributionMicroscale residual stress measurement in steel using focused ion beam slotting and digital image correlation
Original languageEnglish
Title of host publicationThe Eighth International Conference on Residual Stresses 6-8 August 2008 - Marriott Denver Tech Center Hotel - Denver, Colorado, U.S.A
Volume52
Publication statusPublished - Aug 2008

Bibliographical note

Conference Organiser: ICDD Conference Services Group

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