| Translated title of the contribution | Microscale residual stress measurement in steel using focused ion beam slotting and digital image correlation |
|---|---|
| Original language | English |
| Title of host publication | The Eighth International Conference on Residual Stresses 6-8 August 2008 - Marriott Denver Tech Center Hotel - Denver, Colorado, U.S.A |
| Volume | 52 |
| Publication status | Published - Aug 2008 |
Bibliographical note
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