| Translated title of the contribution | Microstructure mapping of interconnects by orientation imaging microscopy |
|---|---|
| Original language | English |
| Pages (from-to) | 1767 - 1771 |
| Journal | Journal of Electronic Materials |
| Volume | 25 |
| Publication status | Published - 1996 |
Bibliographical note
Publisher: Minerals Metals Materials SocCite this
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