Modelling NEM Relays for Digital Circuit Applications

Sunil Rana; Tian Qin; Dinesh Pamunuwa; Daniel Grogg; Michel Despont; Yu Pu; Christoph Hagleitner

doi:10.1109/ISCAS.2013.6571969

Modelling NEM Relays for Digital Circuit Applications

Sunil Rana, Tian Qin, Dinesh Pamunuwa, Daniel Grogg, Michel Despont, Yu Pu, Christoph Hagleitner

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

6 Citations (Scopus)

Abstract

A reduced-order model for NEM relays is presented that combines electro-mechanical beam actuation and landing of beam tip on the surface electrode. This model shows a deviation of less than 2%, for the DC as well as the transient response for beam actuation in a circuit simulation, when compared to a finite-element simulation. It also shows an excellent match for the energy. The model allows accurate circuit simulation to aid in NEM-relay based logic design, and facilitates the quantification of key gate-level metrics.

Original language	English
Title of host publication	Proceedings - IEEE International Symposium on Circuits and Systems
Pages	805-808
Number of pages	4
DOIs	https://doi.org/10.1109/ISCAS.2013.6571969
Publication status	Published - 1 May 2013
Event	2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013 - Beijing, China Duration: 19 May 2013 → 23 May 2013

Conference

Conference	2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013
Country	China
City	Beijing
Period	19/05/13 → 23/05/13

Keywords

electrodes
finite element analysis
logic design
nanoelectromechanical devices
relays
NEM-relay based logic design
circuit simulation
digital circuit applications
electromechanical beam actuation
finite-element simulation
key gate-level metric quantification
reduced-order model
surface electrode
Capacitors
Computational modeling
Integrated circuit modeling
Logic gates
Mathematical model
Read only memory
Relays

Access to Document

10.1109/ISCAS.2013.6571969

Link to publication in Scopus

Fingerprint Dive into the research topics of 'Modelling NEM Relays for Digital Circuit Applications'. Together they form a unique fingerprint.

Cite this

@inproceedings{2c1e253913b748b3a132db7d78b9d1a7,

title = "Modelling NEM Relays for Digital Circuit Applications",

abstract = "A reduced-order model for NEM relays is presented that combines electro-mechanical beam actuation and landing of beam tip on the surface electrode. This model shows a deviation of less than 2%, for the DC as well as the transient response for beam actuation in a circuit simulation, when compared to a finite-element simulation. It also shows an excellent match for the energy. The model allows accurate circuit simulation to aid in NEM-relay based logic design, and facilitates the quantification of key gate-level metrics.",

keywords = "electrodes, finite element analysis, logic design, nanoelectromechanical devices, relays, NEM-relay based logic design, circuit simulation, digital circuit applications, electromechanical beam actuation, finite-element simulation, key gate-level metric quantification, reduced-order model, surface electrode, Capacitors, Computational modeling, Integrated circuit modeling, Logic gates, Mathematical model, Read only memory, Relays",

author = "Sunil Rana and Tian Qin and Dinesh Pamunuwa and Daniel Grogg and Michel Despont and Yu Pu and Christoph Hagleitner",

year = "2013",

month = may,

day = "1",

doi = "10.1109/ISCAS.2013.6571969",

language = "English",

isbn = "9781467357609",

pages = "805--808",

booktitle = "Proceedings - IEEE International Symposium on Circuits and Systems",

note = "2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013 ; Conference date: 19-05-2013 Through 23-05-2013",

}

TY - GEN

T1 - Modelling NEM Relays for Digital Circuit Applications

AU - Rana, Sunil

AU - Qin, Tian

AU - Pamunuwa, Dinesh

AU - Grogg, Daniel

AU - Despont, Michel

AU - Pu, Yu

AU - Hagleitner, Christoph

PY - 2013/5/1

Y1 - 2013/5/1

N2 - A reduced-order model for NEM relays is presented that combines electro-mechanical beam actuation and landing of beam tip on the surface electrode. This model shows a deviation of less than 2%, for the DC as well as the transient response for beam actuation in a circuit simulation, when compared to a finite-element simulation. It also shows an excellent match for the energy. The model allows accurate circuit simulation to aid in NEM-relay based logic design, and facilitates the quantification of key gate-level metrics.

AB - A reduced-order model for NEM relays is presented that combines electro-mechanical beam actuation and landing of beam tip on the surface electrode. This model shows a deviation of less than 2%, for the DC as well as the transient response for beam actuation in a circuit simulation, when compared to a finite-element simulation. It also shows an excellent match for the energy. The model allows accurate circuit simulation to aid in NEM-relay based logic design, and facilitates the quantification of key gate-level metrics.

KW - electrodes

KW - finite element analysis

KW - logic design

KW - nanoelectromechanical devices

KW - relays

KW - NEM-relay based logic design

KW - circuit simulation

KW - digital circuit applications

KW - electromechanical beam actuation

KW - finite-element simulation

KW - key gate-level metric quantification

KW - reduced-order model

KW - surface electrode

KW - Capacitors

KW - Computational modeling

KW - Integrated circuit modeling

KW - Logic gates

KW - Mathematical model

KW - Read only memory

KW - Relays

UR - http://www.scopus.com/inward/record.url?scp=84883377238&partnerID=8YFLogxK

U2 - 10.1109/ISCAS.2013.6571969

DO - 10.1109/ISCAS.2013.6571969

M3 - Conference Contribution (Conference Proceeding)

SN - 9781467357609

SP - 805

EP - 808

BT - Proceedings - IEEE International Symposium on Circuits and Systems

T2 - 2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013

Y2 - 19 May 2013 through 23 May 2013

ER -