Abstract
A reduced-order model for NEM relays is presented that combines electro-mechanical beam actuation and landing of beam tip on the surface electrode. This model shows a deviation of less than 2%, for the DC as well as the transient response for beam actuation in a circuit simulation, when compared to a finite-element simulation. It also shows an excellent match for the energy. The model allows accurate circuit simulation to aid in NEM-relay based logic design, and facilitates the quantification of key gate-level metrics.
| Original language | English |
|---|---|
| Title of host publication | Proceedings - IEEE International Symposium on Circuits and Systems |
| Pages | 805-808 |
| Number of pages | 4 |
| DOIs | |
| Publication status | Published - 1 May 2013 |
| Event | 2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013 - Beijing, China Duration: 19 May 2013 → 23 May 2013 |
Conference
| Conference | 2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013 |
|---|---|
| Country/Territory | China |
| City | Beijing |
| Period | 19/05/13 → 23/05/13 |
Research Groups and Themes
- Photonics and Quantum
Keywords
- electrodes
- finite element analysis
- logic design
- nanoelectromechanical devices
- relays
- NEM-relay based logic design
- circuit simulation
- digital circuit applications
- electromechanical beam actuation
- finite-element simulation
- key gate-level metric quantification
- reduced-order model
- surface electrode
- Capacitors
- Computational modeling
- Integrated circuit modeling
- Logic gates
- Mathematical model
- Read only memory
- Relays
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