Modelling oscillatory flexure modes of an atomic force microscope cantilever in contact mode whilst imaging at high speed

Research output: Contribution to journalArticle (Academic Journal)peer-review

17 Citations (Scopus)

Abstract

Understanding the modal response of an atomic force microscope is important for the identification of image artefacts captured using contact mode atomic force microscopy (AFM). As the scan rate of high-speed AFM increases these modes present themselves as ever clearer noise patterns as the frequency of cantilever vibration falls under the frequency of pixel collection. An Euler-Bernoulli beam equation is used to simulate the flexural modes of the cantilever of an atomic force microscope as it images a hard surface in contact mode. Theoretical results are compared with experimental recordings taken in the high speed regime, as well as previous analytical results. It is shown that the model can capture the mode shapes and resonance properties of the first four eigenmodes.
Translated title of the contributionModelling oscillatory flexure modes of an atomic force microscope cantilever in contact mode whilst imaging at high speed
Original languageEnglish
Article number265702
JournalNanotechnology
Volume23
Issue number26
DOIs
Publication statusPublished - 2012

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  • Purdue University

    Oliver D Payton (Visiting researcher)

    3 Mar 201310 Mar 2013

    Activity: Visiting an external institution typesVisiting an external academic institution

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