Abstract
A slanted tri-gate geometry improves electric field management in multi-channel AlGaN/GaN power transistors leading to higher breakdown voltage and lower on-resistance.
| Original language | English |
|---|---|
| Pages (from-to) | 553-554 |
| Number of pages | 2 |
| Journal | Nature Electronics |
| Volume | 2 |
| Issue number | 12 |
| DOIs |
|
| Publication status | Published - 1 Dec 2019 |
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