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Nanoelectromechanical Binary Comparator for Edge-Computing Applications

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

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Abstract

Bitwise comparison is a fundamental operation in many digital arithmetic functions and is ubiquitous in both datapath and control elements; for example, many machine learning algorithms depend on binary comparison. This work proposes a new class of binary comparator circuit using 4-terminal nanoelectromechanical (NEM) relays that use just 6 devices compared to 9 transistors in CMOS implementations. Moreover, NEM implementations are capable of withstanding much higher temperatures, up to 300°C, and radiation levels, well over 1 Mrad absorbed dose, conditions which are common across many industrial edge applications, with near zero standby power. A 1-bit magnitude and equality comparators comprising two in-plane silicon 4-terminal relays each were fabricated on a silicon-on-insulator substrate and electrically characterized for proof of concept, the first such demonstration. Using the 1-bit comparators as building blocks, a scalable tree-based topology is proposed to implement higher-order comparators, resulting in ≈47% reduction in device count over a CMOS implementation for a 64-bit comparator. Circuit level simulations of the comparators using accurate device models show that a single operation consumes at most 21 fJ a 9-fold reduction over the best CMOS offering in an equivalent process node.
Original languageEnglish
Title of host publication2025 Design, Automation & Test in Europe Conference (DATE)
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Number of pages7
ISBN (Electronic)9783982674100
ISBN (Print)9798331534646
DOIs
Publication statusPublished - 21 May 2025
EventDesign, Automation and Test in Europe 2025 (DATE25) - Lyon, France
Duration: 31 Mar 20252 Apr 2025
https://www.date-conference.com/

Publication series

Name Proceedings - Design, Automation, and Test in Europe Conference and Exhibition
PublisherIEEE
ISSN (Print)1530-1591
ISSN (Electronic)1558-1101

Conference

ConferenceDesign, Automation and Test in Europe 2025 (DATE25)
Abbreviated titleDATE 2025
Country/TerritoryFrance
CityLyon
Period31/03/252/04/25
Internet address

Bibliographical note

Publisher Copyright:
© 2025 EDAA.

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