Nanoscale dislocation patterning by scratching in an atomic force microscope

FA Ponce, QY Wei, ZH Wu, HD Fonseca Filho, CM Almeida, R Prioli, D Cherns

Research output: Contribution to journal › Article (Academic Journal) › peer-review

10 Citations (Scopus)

Translated title of the contribution	Nanoscale dislocation patterning by scratching in an atomic force microscope
Original language	English
Pages (from-to)	076106
Journal	Journal of Applied Physics
Volume	106
Publication status	Published - 2009

Handle.net

@article{f2d86f1f55b141a68e3caca38bbd91a4,

title = "Nanoscale dislocation patterning by scratching in an atomic force microscope",

author = "FA Ponce and QY Wei and ZH Wu and {Fonseca Filho}, HD and CM Almeida and R Prioli and D Cherns",

year = "2009",

language = "English",

volume = "106",

pages = "076106",

journal = "Journal of Applied Physics",

issn = "1089-7550",

publisher = "American Institute of Physics (AIP)",

}