Nanoscale dislocation patterning by scratching in an atomic force microscope

FA Ponce, QY Wei, ZH Wu, HD Fonseca Filho, CM Almeida, R Prioli, D Cherns

Research output: Contribution to journalArticle (Academic Journal)

7 Citations (Scopus)
Translated title of the contributionNanoscale dislocation patterning by scratching in an atomic force microscope
Original languageEnglish
Pages (from-to)076106
JournalJournal of Applied Physics
Volume106
Publication statusPublished - 2009

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