Near-field fluorescence imaging with 32 nm resolution based on microfabricated cantilevered probes

R Eckert, JM Freyland, H Gersen, H Heinzelmann, G Schurmann, W Noell, U Staufer, NF de Rooij

Research output: Contribution to journalArticle (Academic Journal)peer-review

75 Citations (Scopus)
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Abstract

High-resolution near-field optical imaging with microfabricated probes is demonstrated. The probes are made from solid quartz tips fabricated at the end of silicon cantilevers and covered with a 60-nm-thick aluminum film. Transmission electron micrographs indicate a continuous aluminum layer at the tip apex. A specially designed instrument combines the advantages of near-field optical and beam-deflection force microscopy. Near-field optical data of latex bead projection patterns in transmission and of single fluorophores have been obtained in constant-height imaging mode. An artifact-free optical resolution of 31.7±3.6 nm has been deduced from full width at half maximum values of single molecule images.
Translated title of the contributionNear-field fluorescence imaging with 32 nm resolution based on microfabricated cantilevered probes
Original languageEnglish
Pages (from-to)3695 - 3697
Number of pages3
JournalApplied Physics Letters
Volume77
Issue number23
DOIs
Publication statusPublished - 4 Dec 2000

Bibliographical note

Publisher: American Institute of Physics

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