Near-field fluorescence imaging with 32 nm resolution based on microfabricated cantilevered probes

R Eckert; JM Freyland; H Gersen; H Heinzelmann; G Schurmann; W Noell; U Staufer; NF de Rooij

doi:10.1063/1.1330571

Near-field fluorescence imaging with 32 nm resolution based on microfabricated cantilevered probes

R Eckert, JM Freyland, H Gersen, H Heinzelmann, G Schurmann, W Noell, U Staufer, NF de Rooij

School of Physics

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Abstract

High-resolution near-field optical imaging with microfabricated probes is demonstrated. The probes are made from solid quartz tips fabricated at the end of silicon cantilevers and covered with a 60-nm-thick aluminum film. Transmission electron micrographs indicate a continuous aluminum layer at the tip apex. A specially designed instrument combines the advantages of near-field optical and beam-deflection force microscopy. Near-field optical data of latex bead projection patterns in transmission and of single fluorophores have been obtained in constant-height imaging mode. An artifact-free optical resolution of 31.7Â±3.6 nm has been deduced from full width at half maximum values of single molecule images.

Translated title of the contribution	Near-field fluorescence imaging with 32 nm resolution based on microfabricated cantilevered probes
Original language	English
Pages (from-to)	3695 - 3697
Number of pages	3
Journal	Applied Physics Letters
Volume	77
Issue number	23
DOIs	https://doi.org/10.1063/1.1330571
Publication status	Published - 4 Dec 2000

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Publisher: American Institute of Physics

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@article{985096ec7c994ac498a7b972d349f3cc,

title = "Near-field fluorescence imaging with 32 nm resolution based on microfabricated cantilevered probes",

abstract = "High-resolution near-field optical imaging with microfabricated probes is demonstrated. The probes are made from solid quartz tips fabricated at the end of silicon cantilevers and covered with a 60-nm-thick aluminum film. Transmission electron micrographs indicate a continuous aluminum layer at the tip apex. A specially designed instrument combines the advantages of near-field optical and beam-deflection force microscopy. Near-field optical data of latex bead projection patterns in transmission and of single fluorophores have been obtained in constant-height imaging mode. An artifact-free optical resolution of 31.7{\^A}±3.6 nm has been deduced from full width at half maximum values of single molecule images.",

author = "R Eckert and JM Freyland and H Gersen and H Heinzelmann and G Schurmann and W Noell and U Staufer and {de Rooij}, NF",

note = "Publisher: American Institute of Physics",

year = "2000",

month = dec,

day = "4",

doi = "10.1063/1.1330571",

language = "English",

volume = "77",

pages = "3695 -- 3697",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics (AIP)",

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TY - JOUR

T1 - Near-field fluorescence imaging with 32 nm resolution based on microfabricated cantilevered probes

AU - Eckert, R

AU - Freyland, JM

AU - Gersen, H

AU - Heinzelmann, H

AU - Schurmann, G

AU - Noell, W

AU - Staufer, U

AU - de Rooij, NF

N1 - Publisher: American Institute of Physics

PY - 2000/12/4

Y1 - 2000/12/4

N2 - High-resolution near-field optical imaging with microfabricated probes is demonstrated. The probes are made from solid quartz tips fabricated at the end of silicon cantilevers and covered with a 60-nm-thick aluminum film. Transmission electron micrographs indicate a continuous aluminum layer at the tip apex. A specially designed instrument combines the advantages of near-field optical and beam-deflection force microscopy. Near-field optical data of latex bead projection patterns in transmission and of single fluorophores have been obtained in constant-height imaging mode. An artifact-free optical resolution of 31.7Â±3.6 nm has been deduced from full width at half maximum values of single molecule images.

AB - High-resolution near-field optical imaging with microfabricated probes is demonstrated. The probes are made from solid quartz tips fabricated at the end of silicon cantilevers and covered with a 60-nm-thick aluminum film. Transmission electron micrographs indicate a continuous aluminum layer at the tip apex. A specially designed instrument combines the advantages of near-field optical and beam-deflection force microscopy. Near-field optical data of latex bead projection patterns in transmission and of single fluorophores have been obtained in constant-height imaging mode. An artifact-free optical resolution of 31.7Â±3.6 nm has been deduced from full width at half maximum values of single molecule images.

U2 - 10.1063/1.1330571

DO - 10.1063/1.1330571

M3 - Article (Academic Journal)

SN - 0003-6951

VL - 77

SP - 3695

EP - 3697

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 23

ER -

Near-field fluorescence imaging with 32 nm resolution based on microfabricated cantilevered probes

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