Noninvasive measurement of chip currents in IGBT modules

PR Palmer, BH Stark, JC Joyce

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

Translated title of the contributionNoninvasive measurement of chip currents in IGBT modules
Original languageEnglish
Title of host publication28th Annual IEEE Power Electronics Specialists Conference (Cat. No.97CH36043, Atlanta
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages166 - 171
Number of pages6
Volume1
ISBN (Print)0780338405
DOIs
Publication statusPublished - 22 Jun 1997

Bibliographical note

Conference Proceedings/Title of Journal: 28th Annual IEEE Power Electronics Specialists Conference (Cat. No.97CH36043
Conference Organiser: IEEE

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