Noninvasive measurement of chip currents in IGBT modules

PR Palmer; BH Stark; JC Joyce

doi:10.1109/PESC.1997.616722

Noninvasive measurement of chip currents in IGBT modules

PR Palmer, BH Stark, JC Joyce

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

Translated title of the contribution	Noninvasive measurement of chip currents in IGBT modules
Original language	English
Title of host publication	28th Annual IEEE Power Electronics Specialists Conference (Cat. No.97CH36043, Atlanta
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	166 - 171
Number of pages	6
Volume	1
ISBN (Print)	0780338405
DOIs	https://doi.org/10.1109/PESC.1997.616722
Publication status	Published - 22 Jun 1997

Bibliographical note

Conference Proceedings/Title of Journal: 28th Annual IEEE Power Electronics Specialists Conference (Cat. No.97CH36043
Conference Organiser: IEEE

Access to Document

10.1109/PESC.1997.616722

http://ieeexplore.ieee.org/search/srchabstract.jsp?arnumber=616722&isnumber=13420&punumber=4860&k2dockey=616722@ieeecnfs&query=%28%28noninvasive+measurement+of+chip+currents+in+igbt+modules%29%3Cin%3Emetadata%29&pos=0

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Cite this

@inproceedings{ea78e0173e964359aedba02aae62aac5,

title = "Noninvasive measurement of chip currents in IGBT modules",

author = "PR Palmer and BH Stark and JC Joyce",

note = "Conference Proceedings/Title of Journal: 28th Annual IEEE Power Electronics Specialists Conference (Cat. No.97CH36043 Conference Organiser: IEEE",

year = "1997",

month = jun,

day = "22",

doi = "10.1109/PESC.1997.616722",

language = "English",

isbn = "0780338405",

volume = "1",

pages = "166 -- 171",

booktitle = "28th Annual IEEE Power Electronics Specialists Conference (Cat. No.97CH36043, Atlanta",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

address = "United States",

}

Noninvasive measurement of chip currents in IGBT modules. / Palmer, PR; Stark, BH; Joyce, JC.
28th Annual IEEE Power Electronics Specialists Conference (Cat. No.97CH36043, Atlanta. Vol. 1 Institute of Electrical and Electronics Engineers (IEEE), 1997. p. 166 - 171.

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

TY - GEN

T1 - Noninvasive measurement of chip currents in IGBT modules

AU - Palmer, PR

AU - Stark, BH

AU - Joyce, JC

N1 - Conference Proceedings/Title of Journal: 28th Annual IEEE Power Electronics Specialists Conference (Cat. No.97CH36043 Conference Organiser: IEEE

PY - 1997/6/22

Y1 - 1997/6/22

U2 - 10.1109/PESC.1997.616722

DO - 10.1109/PESC.1997.616722

M3 - Conference Contribution (Conference Proceeding)

SN - 0780338405

VL - 1

SP - 166

EP - 171

BT - 28th Annual IEEE Power Electronics Specialists Conference (Cat. No.97CH36043, Atlanta

PB - Institute of Electrical and Electronics Engineers (IEEE)

ER -