@inproceedings{993a67c5e45a43068d860fbe9d446edc,
title = "Novel MC/DC Coverage Test Sets Generation Algorithm, and MC/DC Design Fault Detection Strength Insights",
abstract = "This paper introduces Modified Condition/Decision Coverage (MC/DC), novel MC/DC coverage test sets generation algorithm named OBSRV, and MC/DC design fault detection strength. The paper presents an overview about MC/DC in terms of the MC/DC definition, MC/DC types, and the conventional MC/DC approaches. It introduces a novel algorithm, called OBSRV, for MC/DC coverage test sets generation. OBSRV resolves MC/DC controllability and observability by using principles found in the D-algorithm that is the foundation for state-of-the-art ATPG. It thereby leverages hardware test principles to advance MC/DC for software, and hardware structural coverage. The paper presents an investigation of the introduced OBSRV algorithm scalability, and complexity to prove its suitability for practical designs. The paper investigates MC/DC functional design faults detection strength, and analyzes empirical results conducted on main design fault classes in microprocessors.",
keywords = "Algorithm, Coverage, Fault Detection, Functional Coverage, Functional Verification, MC/DC, Structural Coverage, Test Generation",
author = "Salem, {Mohamed A.} and Eder, {Kerstin I.}",
year = "2016",
month = sep,
doi = "10.1109/MTV.2015.15",
language = "English",
isbn = "9781509008865",
series = "Proceedings of the International Workshop on Microprocessor and SOC Test and Verification (MTV)",
publisher = "Institute of Electrical and Electronics Engineers (IEEE)",
pages = "32--37",
booktitle = "2015 16th International Workshop on Microprocessor and SOC Test and Verification (MTV 2015)",
address = "United States",
note = "16th International Workshop on Microprocessor and SOC Test and Verification, MTV 2015 ; Conference date: 03-12-2015 Through 04-12-2015",
}