Novel MC/DC Coverage Test Sets Generation Algorithm, and MC/DC Design Fault Detection Strength Insights

Mohamed A. Salem, Kerstin I. Eder

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

1 Citation (Scopus)
385 Downloads (Pure)

Abstract

This paper introduces Modified Condition/Decision Coverage (MC/DC), novel MC/DC coverage test sets generation algorithm named OBSRV, and MC/DC design fault detection strength. The paper presents an overview about MC/DC in terms of the MC/DC definition, MC/DC types, and the conventional MC/DC approaches. It introduces a novel algorithm, called OBSRV, for MC/DC coverage test sets generation. OBSRV resolves MC/DC controllability and observability by using principles found in the D-algorithm that is the foundation for state-of-the-art ATPG. It thereby leverages hardware test principles to advance MC/DC for software, and hardware structural coverage. The paper presents an investigation of the introduced OBSRV algorithm scalability, and complexity to prove its suitability for practical designs. The paper investigates MC/DC functional design faults detection strength, and analyzes empirical results conducted on main design fault classes in microprocessors.

Original languageEnglish
Title of host publication2015 16th International Workshop on Microprocessor and SOC Test and Verification (MTV 2015)
Subtitle of host publicationProceedings of a meeting held 3-4 December 2015, Austin, Texas, USA
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages32-37
Number of pages6
ISBN (Electronic)9781509008858
ISBN (Print)9781509008865
DOIs
Publication statusPublished - Sep 2016
Event16th International Workshop on Microprocessor and SOC Test and Verification, MTV 2015 - Austin, United States
Duration: 3 Dec 20154 Dec 2015

Publication series

NameProceedings of the International Workshop on Microprocessor and SOC Test and Verification (MTV)
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
ISSN (Print)2332-5674

Conference

Conference16th International Workshop on Microprocessor and SOC Test and Verification, MTV 2015
CountryUnited States
CityAustin
Period3/12/154/12/15

Keywords

  • Algorithm
  • Coverage
  • Fault Detection
  • Functional Coverage
  • Functional Verification
  • MC/DC
  • Structural Coverage
  • Test Generation

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