Novel Raman spectroscopy imaging in electronic devices: focus on device reliability

Research output: Contribution to conference › Other Conference Contribution

Original language	English
Publication status	Published - 24 Jan 2012
Event	2012 International Workshop on Advanced Nanovision Science - Shizuoka, Hamamatsu, Japan Duration: 23 Jan 2012 → 24 Jan 2012

Conference	2012 International Workshop on Advanced Nanovision Science
Country	Japan
City	Shizuoka, Hamamatsu
Period	23/01/12 → 24/01/12
Other	Research Institute of Electronics Shizuoka University,

Structured keywords

@conference{92466fd3940e49039008a857fc6b7595,

title = "Novel Raman spectroscopy imaging in electronic devices: focus on device reliability",

keywords = "Reliabilty, GaN HEMTs, imaging",

author = "Andrei Sarua and Pomeroy, {James W} and Uren, {Michael J} and Kuball, {Martin H H}",

year = "2012",

month = jan,

day = "24",

language = "English",

note = "2012 International Workshop on Advanced Nanovision Science ; Conference date: 23-01-2012 Through 24-01-2012",

}

TY - CONF

T1 - Novel Raman spectroscopy imaging in electronic devices: focus on device reliability

AU - Sarua, Andrei

AU - Pomeroy, James W

AU - Uren, Michael J

AU - Kuball, Martin H H

PY - 2012/1/24

Y1 - 2012/1/24

KW - Reliabilty

KW - GaN HEMTs

KW - imaging

M3 - Other Conference Contribution

T2 - 2012 International Workshop on Advanced Nanovision Science

Y2 - 23 January 2012 through 24 January 2012

ER -