Novel Raman spectroscopy imaging in electronic devices: focus on device reliability

Research output: Contribution to conferenceOther Conference Contribution

Original languageEnglish
Publication statusPublished - 24 Jan 2012
Event2012 International Workshop on Advanced Nanovision Science - Shizuoka, Hamamatsu, Japan
Duration: 23 Jan 201224 Jan 2012

Conference

Conference2012 International Workshop on Advanced Nanovision Science
CountryJapan
CityShizuoka, Hamamatsu
Period23/01/1224/01/12
OtherResearch Institute of Electronics Shizuoka University,

Structured keywords

  • CDTR

Keywords

  • Reliabilty
  • GaN HEMTs
  • imaging

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