Novel Raman spectroscopy imaging in electronic devices: focus on device reliability

Andrei Sarua; James W Pomeroy; Michael J Uren; Martin H H Kuball

Novel Raman spectroscopy imaging in electronic devices: focus on device reliability

Andrei Sarua, James W Pomeroy, Michael J Uren, Martin H H Kuball

School of Physics

Research output: Contribution to conference › Other Conference Contribution

Original language	English
Publication status	Published - 24 Jan 2012
Event	2012 International Workshop on Advanced Nanovision Science - Shizuoka, Hamamatsu, Japan Duration: 23 Jan 2012 → 24 Jan 2012

Conference

Conference	2012 International Workshop on Advanced Nanovision Science
Country/Territory	Japan
City	Shizuoka, Hamamatsu
Period	23/01/12 → 24/01/12
Other	Research Institute of Electronics Shizuoka University,

Research Groups and Themes

CDTR

Keywords

Reliabilty
GaN HEMTs
imaging

Access to Document

http://www.rie.shizuoka.ac.jp/pdf/Program3rev.pdf

Handle.net

Persistent link

2 Article (Academic Journal)
1 Conference Contribution (Conference Proceeding)

Raman-IR micro-thermography tool for reliability and failure analysis of electronic devices
Sarua, A., Pomeroy, J., Kuball, M., Falk, A., Albright, G., Uren, M. & Martin, T., Jul 2008, 15th Int. Symp. on the Physical and Failure Analysis of Integrated Circuits, Singapore July 2008. Institute of Electrical and Electronics Engineers (IEEE)
Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)
3 Citations (Scopus)
Thermal Boundary Resistance Between GaN and Substrate in AlGaN/GaN Electronic Devices
Sarua, A., Ji, H., Hilton, K., Wallis, D., Uren, M., Martin, T. & Kuball, M., Dec 2007, In: IEEE Transactions on Electron Devices. 54(12), p. 3152 - 3158 7 p.
Research output: Contribution to journal › Article (Academic Journal) › peer-review

268 Citations (Scopus)
Thermal mapping of defects in AlGaN/GaN heterostructure field-effect transistors using micro-Raman spectroscopy
Pomeroy, J., Kuball, M., Wallis, D., Keir, A., Hilton, K., Balmer, R., Uren, M., Martin, T. & Heard, P., Sept 2005, In: Applied Physics Letters. 87(10), p. 103508-1 - 103508-3 3 p.
Research output: Contribution to journal › Article (Academic Journal) › peer-review

36 Citations (Scopus)

Cite this

@conference{92466fd3940e49039008a857fc6b7595,

title = "Novel Raman spectroscopy imaging in electronic devices: focus on device reliability",

keywords = "Reliabilty, GaN HEMTs, imaging",

author = "Andrei Sarua and Pomeroy, {James W} and Uren, {Michael J} and Kuball, {Martin H H}",

year = "2012",

month = jan,

day = "24",

language = "English",

note = "2012 International Workshop on Advanced Nanovision Science ; Conference date: 23-01-2012 Through 24-01-2012",

}

TY - CONF

T1 - Novel Raman spectroscopy imaging in electronic devices: focus on device reliability

AU - Sarua, Andrei

AU - Pomeroy, James W

AU - Uren, Michael J

AU - Kuball, Martin H H

PY - 2012/1/24

Y1 - 2012/1/24

KW - Reliabilty

KW - GaN HEMTs

KW - imaging

M3 - Other Conference Contribution

T2 - 2012 International Workshop on Advanced Nanovision Science

Y2 - 23 January 2012 through 24 January 2012

ER -

Novel Raman spectroscopy imaging in electronic devices: focus on device reliability

Conference

Research Groups and Themes

Keywords

Access to Document

Handle.net

Research output

Raman-IR micro-thermography tool for reliability and failure analysis of electronic devices

Thermal Boundary Resistance Between GaN and Substrate in AlGaN/GaN Electronic Devices

Thermal mapping of defects in AlGaN/GaN heterostructure field-effect transistors using micro-Raman spectroscopy

Cite this