Oblique incidence reflectivity difference as an in situ probe of Co electrodeposition on polycrystalline Au

W Schwarzacher, J Gray, XD Zhu

Research output: Contribution to journalArticle (Academic Journal)peer-review

19 Citations (Scopus)

Abstract

We apply a special form of ellipsometry, oblique incidence optical reflectivity difference (OI-RD), which is optimized to detect changes at a surface, to Co electrodeposition on polycrystalline Au. The OI-RD signal is shown to be proportional to Co thickness and thus enables the separation of the Co deposition and H-2 evolution partial currents. Competition between the two processes gives rise to interesting effects, including the observation of a peak in the Co partial current during both the anodic and cathodic sweeps of a cyclic voltammogram taken after repeated cycles of Co deposition and dissolution.
Translated title of the contributionOblique incidence reflectivity difference as an in situ probe of Co electrodeposition on polycrystalline Au
Original languageEnglish
Pages (from-to)C73 - C76
Number of pages4
JournalElectrochem. Solid State Lett
Volume6 (5)
Publication statusPublished - 2003

Bibliographical note

Publisher: Electrochemical Soc. Inc

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