| Translated title of the contribution | Observation of crystal distortions in SiGe/Si superlattice using a new application of large angle convergent beam electron diffraction |
|---|---|
| Original language | English |
| Pages (from-to) | 435 - 440 |
| Journal | Ultramicroscopy |
| Volume | 58 |
| Publication status | Published - 1995 |
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