Ohmic Contact-Free Mobility Measurement in Ultra-Wide Bandgap AlGaN/AlGaN Devices

Peter A. Butler*, William M. Waller, Michael J. Uren, Andrew Allerman, Andrew Armstrong, Robert Kaplar, Martin Kuball

*Corresponding author for this work

Research output: Contribution to journal › Article (Academic Journal) › peer-review

4 Citations (Scopus)
358 Downloads (Pure)

Fingerprint

Dive into the research topics of 'Ohmic Contact-Free Mobility Measurement in Ultra-Wide Bandgap AlGaN/AlGaN Devices'. Together they form a unique fingerprint.

Physics

Material Science