On the characterisation of the interfacial toughness in a novel “GaN-on-Diamond” material for high-power RF devices

Research output: Contribution to journal › Article (Academic Journal) › peer-review

Original language	English
Journal	ACS Applied Electronic Materials
Publication status	Published - 18 Feb 2019

Access to Document

@article{1429d7eb177d4d58892322fd684add0d,

title = "On the characterisation of the interfacial toughness in a novel “GaN-on-Diamond” material for high-power RF devices",

author = "Dong Liu and Martin Kuball",

year = "2019",

month = feb,

day = "18",

language = "English",

journal = "ACS Applied Electronic Materials",

issn = "2637-6113",

publisher = "American Chemical Society",

}