On the modeling of losses in short length photonic crystal waveguides

MJ Cryan

doi:10.1109/JLT.2009.2028658

On the modeling of losses in short length photonic crystal waveguides

MJ Cryan

Research output: Contribution to journal › Article (Academic Journal) › peer-review

5 Citations (Scopus)

337 Downloads (Pure)

Abstract

The 3-D finite difference time domain (FDTD) cut-back method is used to study losses in non-disordered photonic crystal silicon membrane waveguides. Losses above the light-line have been shown to be in good agreement with other methods. Below the light-line, however, FDTD is predicting a rapid increase in losses. This paper studies the possible causes for this effect, including meshing effects, back reflections, and finite thickness sidewalls. It is found that since below the light-line the group index becomes very high and the loss becomes very low, strong Fabry-Perot oscillations dominate the cut-back results. The paper also discusses the impact of operating near to the cut-off wavelength of the photonic crystal waveguide Bloch mode and the implications this has for loss calculation.

Translated title of the contribution	On the modeling of losses in short length photonic crystal waveguides
Original language	English
Pages (from-to)	4841 - 4847
Number of pages	7
Journal	Journal of Lightwave Technology
Volume	27
Issue number	21
DOIs	https://doi.org/10.1109/JLT.2009.2028658
Publication status	Published - Nov 2009

Bibliographical note

Publisher: IEEE
Rose publication type: Journal article

Sponsorship: The author would like to thank Prof. Railton and Prof. Craddoock for their work in developing the FDTD codeused here, and Prof. J. McGeehan for the use of the Condor
computing cluster which was donated to the Department of Electrical and Electronic Engineering by Toshiba Research Labs Europe.

Terms of use: Copyright © 2009 IEEE. Reprinted from Journal of Lightwave Technology.

This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of the University of Bristol's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org.

By choosing to view this document, you agree to all provisions of the copyright laws protecting it.

Keywords

photonic crystals

Access to Document

10.1109/JLT.2009.2028658

Cryan IEEE Lightwave Technology November 2009Accepted author manuscript, 1 MB

http://hdl.handle.net/1983/1675

Handle.net

Persistent link

Cite this

@article{36151cf2a3644aa497d726bbe0c1bdc4,

title = "On the modeling of losses in short length photonic crystal waveguides",

abstract = "The 3-D finite difference time domain (FDTD) cut-back method is used to study losses in non-disordered photonic crystal silicon membrane waveguides. Losses above the light-line have been shown to be in good agreement with other methods. Below the light-line, however, FDTD is predicting a rapid increase in losses. This paper studies the possible causes for this effect, including meshing effects, back reflections, and finite thickness sidewalls. It is found that since below the light-line the group index becomes very high and the loss becomes very low, strong Fabry-Perot oscillations dominate the cut-back results. The paper also discusses the impact of operating near to the cut-off wavelength of the photonic crystal waveguide Bloch mode and the implications this has for loss calculation.",

keywords = "photonic crystals",

author = "MJ Cryan",

note = "Publisher: IEEE Rose publication type: Journal article Sponsorship: The author would like to thank Prof. Railton and Prof. Craddoock for their work in developing the FDTD codeused here, and Prof. J. McGeehan for the use of the Condor computing cluster which was donated to the Department of Electrical and Electronic Engineering by Toshiba Research Labs Europe. Terms of use: Copyright {\textcopyright} 2009 IEEE. Reprinted from Journal of Lightwave Technology. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of the University of Bristol's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it. ",

year = "2009",

month = nov,

doi = "10.1109/JLT.2009.2028658",

language = "English",

volume = "27",

pages = "4841 -- 4847",

journal = "Journal of Lightwave Technology",

issn = "0733-8724",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

number = "21",

}

TY - JOUR

T1 - On the modeling of losses in short length photonic crystal waveguides

AU - Cryan, MJ

N1 - Publisher: IEEE Rose publication type: Journal article Sponsorship: The author would like to thank Prof. Railton and Prof. Craddoock for their work in developing the FDTD codeused here, and Prof. J. McGeehan for the use of the Condor computing cluster which was donated to the Department of Electrical and Electronic Engineering by Toshiba Research Labs Europe. Terms of use: Copyright © 2009 IEEE. Reprinted from Journal of Lightwave Technology. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of the University of Bristol's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.

PY - 2009/11

Y1 - 2009/11

N2 - The 3-D finite difference time domain (FDTD) cut-back method is used to study losses in non-disordered photonic crystal silicon membrane waveguides. Losses above the light-line have been shown to be in good agreement with other methods. Below the light-line, however, FDTD is predicting a rapid increase in losses. This paper studies the possible causes for this effect, including meshing effects, back reflections, and finite thickness sidewalls. It is found that since below the light-line the group index becomes very high and the loss becomes very low, strong Fabry-Perot oscillations dominate the cut-back results. The paper also discusses the impact of operating near to the cut-off wavelength of the photonic crystal waveguide Bloch mode and the implications this has for loss calculation.

AB - The 3-D finite difference time domain (FDTD) cut-back method is used to study losses in non-disordered photonic crystal silicon membrane waveguides. Losses above the light-line have been shown to be in good agreement with other methods. Below the light-line, however, FDTD is predicting a rapid increase in losses. This paper studies the possible causes for this effect, including meshing effects, back reflections, and finite thickness sidewalls. It is found that since below the light-line the group index becomes very high and the loss becomes very low, strong Fabry-Perot oscillations dominate the cut-back results. The paper also discusses the impact of operating near to the cut-off wavelength of the photonic crystal waveguide Bloch mode and the implications this has for loss calculation.

KW - photonic crystals

U2 - 10.1109/JLT.2009.2028658

DO - 10.1109/JLT.2009.2028658

M3 - Article (Academic Journal)

VL - 27

SP - 4841

EP - 4847

JO - Journal of Lightwave Technology

JF - Journal of Lightwave Technology

SN - 0733-8724

IS - 21

ER -

On the modeling of losses in short length photonic crystal waveguides

Abstract

Bibliographical note

Keywords

Access to Document

Handle.net

Fingerprint

Cite this