Abstract
We study the one-dimensional Schrödinger equation with a disordered potential of the form V(x)=ϕ(x)2+ϕ′(x)+κ(x)where ϕ(x) is a Gaussian white noise with mean μg and variance g, and κ(x) is a random superposition of delta functions distributed uniformly on the real line with mean density ρ and mean strength v.
Our study is motivated by the close connection between this problem and
classical diffusion in a random environment (the Sinai problem) in the
presence of random absorbers: ϕ(x) models the force field acting on the diffusing particle and κ(x)
models the absorption properties of the medium in which the diffusion
takes place. The focus is on the calculation of the complex Lyapunov
exponent Ω(E)=γ(E)−iπN(E), where N is the integrated density of states per unit length and γ
the reciprocal of the localisation length. By using the continuous
version of the Dyson–Schmidt method, we find an exact formula, in terms
of a Hankel function, in the particular case where the strength of the
delta functions is exponentially-distributed with mean v=2g.
Building on this result, we then solve the general case— in the
low-energy limit— in terms of an infinite sum of Hankel functions. Our
main result, valid without restrictions on the parameters of the model,
is that the integrated density of states exhibits the power law
behaviour N(E)∼E→0+Eνwhere ν=μ2+2ρ/g−−−−−−−−√.This confirms and extends several results obtained previously by approximate methods.
Original language | English |
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Pages (from-to) | 237–276 |
Number of pages | 40 |
Journal | Journal of Statistical Physics |
Volume | 155 |
Issue number | 2 |
Early online date | 28 Feb 2014 |
DOIs | |
Publication status | Published - 1 Apr 2014 |
Keywords
- Primary 82B44
- Secondary 60G51
- Disordered 1D quantum mechanics
- Anderson localisation
- Classical diffusion in random environment
- Sinai problem
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Dr Yves J M Tourigny
- Probability, Analysis and Dynamics
- School of Mathematics - Senior Lecturer in Numerical Analysis
- Applied Mathematics
- Mathematical Physics
Person: Academic , Member