Over-The-Air Test Method for Evaluation of 5G Millimeter-Wave Devices under 3D Spatially Dynamic Environment from Single Feeder

Mark A Beach, David Reyes*, Moray Rumney

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

1 Citation (Scopus)
79 Downloads (Pure)

Abstract

This paper presents a novel Over-the-Air test method that facilitates the excitation of 5G New Radio mobile devices from multiple Angles-of-Arrival in 3D-space to perform Radio Resource Management (RRM) testing, required to evaluate the beamforming capabilities when operating at millimeter wave frequencies. The aim of this test system is to recreate realistic operating propagation conditions in both spatial and temporal domains. The advantage of this method is that up to four simultaneous signals can be generated by a single
2D feeder antenna array with multiple independent radio frequency ports from a unique location, minimizing the use of mechanical positioners. This is achieved by the implementation of multiple plane reflectors tangentially placed to the surface of a semi-ellipsoid. The Device Under Test and Feeder antennas are
centered at the foci, respectively. Simulations and measurements performed show the ability of this method to create the required test environment to test RRM requirements
Original languageEnglish
Title of host publication2022 IEEE/MTT-S International Microwave Symposium - IMS 2022
PublisherIEEE Microwave Theory and Techniques Society
Pages390-393
Number of pages4
ISBN (Electronic)978-1-6654-9613-1
ISBN (Print)978-1-6654-9614-8
DOIs
Publication statusPublished - 29 Aug 2022

Publication series

NameIEEE MTT-S International Microwave Symposium Digest
Volume2022-June
ISSN (Print)0149-645X

Bibliographical note

Funding Information:
ACKNOWLEDGMENT This work was supported by EPSRC CDT in Communications EP/I028153, Keysight Technologies and Secretaría Nacional de Educación Superior, Ciencia, Tecnología e Innovación (SENESCYT)-Ecuador.

Publisher Copyright:
© 2022 IEEE.

Keywords

  • OTA

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