P3 (Power-Performance-Process) Optimization of Nano-CMOS SRAM using Statistical DOE-ILP

Thakral G.; Mohanty S. P.; Dhiraj Pradhan

P3 (Power-Performance-Process) Optimization of Nano-CMOS SRAM using Statistical DOE-ILP

Thakral G., Mohanty S. P., Dhiraj Pradhan

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

6 Citations (Scopus)

Translated title of the contribution	P3 (Power-Performance-Process) Optimization of Nano-CMOS SRAM using Statistical DOE-ILP
Original language	English
Title of host publication	11th IEEE International Symposium on Quality Electronic Design (ISQED)
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Publication status	Published - 2010

Bibliographical note

Other page information: -
Conference Proceedings/Title of Journal: 11th IEEE International Symposium on Quality Electronic Design (ISQED)
Other identifier: 2001148

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http://www.cs.bris.ac.uk/Publications/pub_master.jsp?id=2001148

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Cite this

@inproceedings{ce769e9f49ef4f8aa57114e1e512383b,

title = "P3 (Power-Performance-Process) Optimization of Nano-CMOS SRAM using Statistical DOE-ILP",

author = "Thakral G. and {S. P.}, Mohanty and Dhiraj Pradhan",

note = "Other page information: - Conference Proceedings/Title of Journal: 11th IEEE International Symposium on Quality Electronic Design (ISQED) Other identifier: 2001148",

year = "2010",

language = "English",

booktitle = "11th IEEE International Symposium on Quality Electronic Design (ISQED)",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

address = "United States",

}

P3 (Power-Performance-Process) Optimization of Nano-CMOS SRAM using Statistical DOE-ILP. / G., Thakral; S. P., Mohanty; Pradhan, Dhiraj.

11th IEEE International Symposium on Quality Electronic Design (ISQED). Institute of Electrical and Electronics Engineers (IEEE), 2010.

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

TY - GEN

T1 - P3 (Power-Performance-Process) Optimization of Nano-CMOS SRAM using Statistical DOE-ILP

AU - G., Thakral

AU - S. P., Mohanty

AU - Pradhan, Dhiraj

N1 - Other page information: - Conference Proceedings/Title of Journal: 11th IEEE International Symposium on Quality Electronic Design (ISQED) Other identifier: 2001148

PY - 2010

Y1 - 2010

M3 - Conference Contribution (Conference Proceeding)

BT - 11th IEEE International Symposium on Quality Electronic Design (ISQED)

PB - Institute of Electrical and Electronics Engineers (IEEE)

ER -